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Tip Geometry: Critical Dimension (Overhang) Tip Height: 10 - 15 Tip Radius (Max): <10 Tip Set Back (Nom): 15 Tip Set Back( RNG): 5 - 25 Tilt Compensation: 3
If a conductive coating is not needed
Bruker's new conductive diamond coated probe provides high performance Scanning Spreading Resistance Microscopy (SSRM)and Piezoresponse Force Microscopy (PFM) to characterize advanced semiconductor devices
25 Cantilever Thickness (RNG): 0
AD-40-P40 Automated AFM Tip Geometry: Critical Dimension (Overhang)DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS High aspect ratio probe for small scale structures. This model offers 100nm tall cylindrical shaped pillar tips with 40nm base diameter, combined with a high 40N m spring constant. As with all Adama probes, these are formed out of single crystal boron doped diamond and are wear resistant and conductive. Suitable for electrical characterization with PeakForce TUNA, TUNA, and CAFM. Tip Geometry:
