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Base and two Locking Nuts)
Ø100mm Pin Mount
Ideal for cleaning contaminants from glassware
Tip-evaluation software provides on-command "worst case" probe-shape diagnosis based on scanning of this roughness sample
Carbon Mount, Hitachi, Int. Thread (M4), 25mm dia. Graphite Vx & UVx Base and two Locking Nuts)DESCRIPTION All our carbon SEM specimen mounts are made from spectrographically pure, the highest purity grade, graphite rods. Total impurity level does not exceed 2ppm and typically less than 1ppm per element. These mounts are ideal for analytical SEM and microprobe work since the only element which can be detected with EDS or WDS systems in their specimen mounts is C. Both electron and X ray absorption is much higher than compared with the standard
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